1. Total integrated scattering test station with nanosecond Nd:YAG laser (Ekspla NL202)
Specific device description | Potential for use (specific activities) | Tariff for the use of the device* (€ per hour) |
The total integrated scattering test station consists of: LabSphere Ulbricht type integrating sphere (spectral range 0.35-1.4 mm), closed-loop air cleaning system (EkoFiltras) with three-stage filters. ISO 6 cleanliness is achieved in the HEPA14 camera. Measurements can be performed using first (1064 nm), second (532 nm) and third (355 nm) harmonics of a nanosecond Nd:YAG Q-switched laser (Ekspla NL 202), producing 9 ns pulses with up to 2 mJ pulse energy at a 1 kHz repetition rate. The station can perform scattering loss measurements on samples with a diameter from 12.7 to 28 mm and thickness from 2 to 6 mm. Sample positioning is possible ±15 mm in x and y directions. Two photomultipliers are used: Hamamatsu H5784-20 for 350 - 900 nm spectral range and PMT R5108 for 400-1200 nm. A National Instruments BNC-2110 16 section converter, optimized for short-pulse registration, is integrated for the registration of the scattered and incident radiation. A computer with software is also integrated in the system. For our measurements, we use the OceanOptics WS-1-SL standard, scattering >98% light in 250 – 1500 and 95% in the 250-2200 nm spectral range. | For the evaluation of total integrated scattering from the whole surface and surface roughness of different optical elements (mirrors, filters, optical substrates, radial polarization converters), which are designed for 1064 nm, 532 nm and 355 nm laser radiation). | 36.19 |
*Price without VAT and accounts only equipment rental costs (excluding staff contribution).
2. I Complex for laser-induced damage threshold measurements
Specific device description | Potential for use (specific activities) | Tariff for the use of the device* (€ per hour) |
High-energy nanosecond laser (Inolas SpitLight Hybrid III) with single longitudinal and transversal mode and 2-5 harmonics generation unit Pulse energy: ≥ 400 mJ @ 1064 nm wavelength; ≥ 190 mJ @ 532 nm wavelength; ≥ 100 mJ @ 355 nm wavelength; ≥ 50 mJ @ 266 nm wavelength; ≥ 8 mJ @ 213 nm wavelength. Pulse duration 8-11 ns, pulse repetition rate ̴50 Hz, beam size ̴ 6 ± 1, divergence < 0.5 mrad. An equipment set for measuring laser radiation temporal, spatial and energetic parameters is also used. It consists of universal Ophir power meters and thermopile type power measurement heads, a Spiricon 190-1100 nm spectral range CCD camera, oscilloscopes, photodiodes. |
For characterization of optical coatings. | 42.80 |
Laser-induced damage threshold (LIDT) test station No.1 (for 1 Hz to 100 kHz) The LIDT station can be used at a laser pulse repetition rate from 1 Hz to 100 kHz. Measurements can be performed for laser radiation of 1030 – 1064 nm, 515 – 532 nm and 343 – 355 nm wavelengths. Automated positioning of the sample in X and Y directions is integrated (range of positioning ≥ 70 mm). An analog digital converter with selection and hold functions for the registration of the scattered and incident pulses is also installed. |
3.61 |
*Price without VAT and accounts only equipment rental costs (excluding staff contribution).
3. II Complex for laser-induced damage threshold measurements
Specific device description | Potential for use (specific activities) | Tariff for the use of the device* (€ per hour) |
Single longitudinal mode nanosecond Nd:YAG laser Laser parameters: Maximum pulse energy 20 mJ, (20 W average power), central wavelength 1064 nm, pulse duration < 8-11 ns and 1 kHz pulse repetition rate. An equipment set for measuring laser radiation temporal, spatial and energetic parameters is also used. It consists of universal Ophir power meters and thermopile-type power measurement heads, a Spiricon 190-1100 nm spectral range CCD camera, an HM2005 200 MHz bandwidth analog oscilloscope and a TDS3032C 300 MHz bandwidth digital oscilloscope, and photodiodes. |
For characterization of optical coatings. | 48.13 |
Laser-induced damage threshold (LIDT) test station No.2 (for 1-10 kHz) The LIDT station can be used at a laser pulse repetition rate from 1 Hz to 10 kHz. Measurements can be performed for laser radiation of 760 – 840 nm, 380 - 420 nm wavelengths. Automated positioning of the sample in XY directions in the target plane (range of positioning ≥ 70 mm). An analog digital converter with selection and hold functions for the registration of the scattered and incident pulses is also installed. |
3.61 |
*Price without VAT and accounts only equipment rental costs (excluding staff contribution).
4. Femtosecond laser micro-fabrication set
Specific device description | Potential for use (specific activities) | Tariff for the use of the device* (€ per hour) |
The set consists of a Pharos femtosecond laser, a large motion five-coordinate precision positioning module with autofocus and control systems and a set of diagnostic equipment. Properties of the laser: Central wavelength is 1030 nm. The integrated harmonic module provides:
Maximum average power is P = 20 W. Pulse energy Eimp >400 μJ at 1-5 kHz frequency range. Pulse duration is τ < 300 fs. Beam quality: M2 < 1.3. Beam ellipticity >0.99. (0.99 at P = 1 W and 610 kHz). Aerotech positioning module: The system is assembled on a granitic plate with control electronics and appropriate software. Technical positioning parameters: 1. X axis (ABL1500WB): maximum motion is 300 mm, speed 2 m/s; 2. Y axis (ABL1500): maximum motion is 300 mm, speed 2 m/s; 3. Z axis (ABL15020): maximum motion 200 mm, speed 2 m/s, accuracy ± 0.5 μm. Technical parameters of rotating axes (ANT130-R): 1. Diameter of the rotating part is 125 mm, accuracy ± 3 arc sec, resolution 0.9; 2. Diameter of the rotating part is 120 mm, accuracy ± 5 arc sec, resolution 0.01 μrad; 3. Total motion of rotating axes: ± 360°. The system also has a two-axis beam control system for 1030 nm wavelength radiation with 10 m /s positioning speed and 1.5 m/s marking speed. There is also an integrated focal tracking system and a computer with installed software for the management of 2-axes beam control and 5-axes sample positioning systems. |
For precise microfabrication of various materials: metals, glasses, semiconductors. | 66.09 |
*Price without VAT and accounts only equipment rental costs (excluding staff contribution).
5. Precision three-coordinate positioning system with a galvanometric beam control subsystem
Specific device description | Potential for use (specific activities) | Tariff for the use of the device* (€ per hour) |
Technical parameters of positioning system:
The system is assembled on a granitic plate. There is motion synchronization with laser pulses and galvanometric scanners. Parameters of the control system for Galvo mirrors hurrySCAN II 10 (Scanlab): suitable for the 400-1100 nm spectral range, positioning speed is 10 m/s, marking speed – 2.5 m/s. |
Laser nanophotonics research: 1. Numerical modeling, laser formation, geometry and optical properties (focus, collimation, phase modulation) description of multifunctional (refractive / diffractive) and integrated (on the optical fiber tip) micro – optical elements (10 – 100 μm). 2. Artificial three-dimensional frame laser formation for cell biology and tissue engineering applications. Biologically inert and degrading polymers can be used, and carcasses can be produced of several different materials. The pore size and filling factor can be varied from 1 to 100 μm and 20-80%, respectively. 3. Laser formation of nanophotonic elements in polymers and transparent material. The laser can also form two-dimensional and three-dimensional fixed and gradually variable period photonic crystals. Their period can be from 0.5 to 10 μm. Numerical modeling of these items and characterization of their light control properties. |
11.26 |
*Price without VAT and accounts only equipment rental costs (excluding staff contribution).
6. Technological system for the formation and processing of polymeric layers
Specific device description | Potential for use (specific activities) | Tariff for the use of the device* (€ per hour) |
The system consists of: 1. A KW-4A Spin-coater (Chemat Technology) coating formation device; 2. An Acton SP2300 (Princeton instruments) spectrometer for the 200-1100 nm spectral range; 3. An AvaSpec (Avantes) spectrometer; 4. A set for measuring optical radiation energy and power (Ophir): energy and power meters with a detectable power range from 10 pW to 5 kW (energy from 10 pJ to 100 J), a PD300-3W photodiode element for power and energy measurement for the 350-1100 nm spectral range with detectable power from 5nW to 3W, a thermoelectric energy and power meter 3A for the 60 μW-3W optical power range (optical energy range is from 20 μJ to2 J) and for 150 nm – 6 μm spectral range; 5. A magnetic stirrer, (Labinco); 6. A DCP 3000 membrane vacuum gauge (Vacuubrand); 7. A set of precise calibrated automated pipettes; 8. A VACUCELL VUS-B2V/VU 22 (MMM) vacuum oven; 9. A UV lamp; 10. A refrigerator; 11. An Electroviewer series 7215 (Electrophysics) camera for IR radiation visualization, in the 400 nm - 1300 nm spectral range; 12. An MD 4 NT (Vacuubrand) vacuum pump; 13. A four – channel oscillograph (Tektronix) with 100 MHz frequency band; 14. An EMMI 20HC (EMAG) ultrasonic cleaner; 15. An HNL050L (Thorlabs) He-Ne 633 nm laser; 16. A metallization device (Quorum Technologies); 17. A heating oven; 18. A chemical fume cupboard (Kottermann); 19. An AX124 (Sartorius) analytical balance; 20. A K850 critical point drier. |
Laser nanophotonics research: 1. Numerical modeling, laser formation, geometry and optical properties (focus, collimation, phase modulation) description of multifunctional (refractive / diffractive) and integrated (on the optical fiber tip) micro – optical elements (10 – 100 μm). 2. Artificial three-dimensional frame laser formation for cell biology and tissue engineering applications. Biologically inert and degrading polymers can be used, and a carcass can be produced of several different materials. The pore size and filling factor can be varied from 1 to 100 μm and 20-80%, respectively. 3. Laser formation of nanophotonic elements in polymers and transparent material. Two-dimensional and three-dimensional fixed and gradually variable period photonic crystals can be produced with the laser. Their period can be from 0.5 to 10 μm. Numerical modeling of these items and characterization of their light control properties. |
12.51 |
*Price without VAT and accounts only equipment rental costs (excluding staff contribution).
7. High-repetition frequency tunable Pharos-SP femtosecond laser system with the Orpheus / Lyra parametric amplifier
Specific device description | Potential for use (specific activities) | Tariff for the use of the device* (€ per hour) |
Properties of the femtosecond laser: central wavelength 1030 ± 10 nm, pulse repetition rate can be tuned in the 1-1000 kHz range, pulse duration ≤200 fs, average power ≥6W at 50-200 kHz, beam quality is M2≤1.3. Properties of the parametric optical amplifier: tuning range is 350-2600 nm, maximum efficiency 15 % (signal+idler), conversion efficiency of integrated second harmonic generator is >50 % (515 nm). |
Laser nanophotonics research: 1. Numerical modeling, laser formation, geometry and optical properties (focus, collimation, phase modulation) description of multifunctional (refractive / diffractive) and integrated (on the optical fiber tip) micro – optical elements (10 – 100 μm). 2. Artificial three-dimensional frame laser formation for cell biology and tissue engineering applications. Biologically inert and degrading polymers can be used, and a carcass can be produced of several different materials. The pore size and filling factor can be varied from 1 to 100 μm and 20-80%, respectively. 3. Laser formation of nanophotonic elements in polymers and transparent material. Two-dimensional and three-dimensional fixed and gradually variable period photonic crystals can be produced with the laser. Their period can be from 0.5 to 10 μm. Numerical modeling of these items and characterization of their light control properties. |
47.70 |
*Price without VAT and accounts only equipment rental costs (excluding staff contribution).