Most important publications |
- Grigaitis, Tomas; Naujokaitis, Arnas; Sabonis, Vytautas; Arlauskas, Kęstutis. Electroluminescence from SiNx layers doped with Ce3+ ions // Thin solid films. Lausanne : Elsevier Science. ISSN 0040-6090. 2017, Vol. 622, p. 142-147. DOI: 10.1016/j.tsf.2016.12.029. [Science Citation Index Expanded (Web of Science); Scopus; Engineering Index] [IF: 1,939; AIF: 4,131; IF/AIF: 0,469; Q2 (2017, InCites JCR SCIE)] [CiteScore: 3,80; SNIP: 0,853; SJR: 0,617; Q1 (2017, Scopus Sources)] [S.fld.: N 002, T 008] [Contribution: 0,250]
- Grigaitis, Tomas; Naujokaitis, Arnas; Juška, Giedrius; Arlauskas, Kęstutis. Influence of sublayer thickness on electroluminescence from a-Si:H/SiNx superlattice structures // Thin solid films. Lausanne : Elsevier Science. ISSN 0040-6090. 2015, Vol. 585, p. 20-23. DOI: 10.1016/j.tsf.2015.03.042. [Science Citation Index Expanded (Web of Science); Scopus; Engineering Index] [IF: 1,761; AIF: 3,428; IF/AIF: 0,513; Q2 (2015, InCites JCR SCIE)] [CiteScore: 3,50; SNIP: 0,915; SJR: 0,680; Q1 (2015, Scopus Sources)] [S.fld.: T 008] [Contribution: 0,250]
- Grigaitis, Tomas; Naujokaitis, Arnas; Tumėnas, Saulius; Juška, Giedrius; Arlauskas, Kęstutis. Characterization of silicon nitride layers deposited in three-electrode plasma-enhanced CVD chamber = Trijų elektrodų pe CVD kameroje užaugintų silicio nitrido sluoksnių tyrimas. // Lithuanian journal of physics. ISSN 1648-8504. 2015, Vol. 55, no. 1, p. 35-43. [Science Citation Index Expanded (Web of Science); PhysNet; INSPEC] [IF: 0,574; AIF: 2,637; IF/AIF: 0,217; Q4 (2015, InCites JCR SCIE)] [CiteScore: 0,90; SNIP: 0,365; SJR: 0,300; Q3 (2015, Scopus Sources)] [S.fld.: N 002] [Contribution: 0,200]
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Participation in the national/international governing bodies, commissions, committees, boards etc.
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Participated in the bachelor thesis defense committee.
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